Fabrication and Characterization of Nanostructured Vanadium Oxide Thin Films for Energy and Optoelectronic Applications
Abstract
In this study, nanostructured vanadium oxide (V₂O₅) thin films were synthesized using a controlled hydrothermal method combined with solvent-assisted techniques and statistical optimization. The hydrothermal synthesis, performed at temperatures between 200°C and 250°C, enabled the formation of well-defined V₂O₅ nanostructures with an average crystallite size ranging from 27 to 35 nm. The films were deposited onto fluorine-doped tin oxide (FTO) substrates using the spray deposition technique, which allowed for precise control over film morphology and uniformity. Characterization of the films was carried out using X-ray diffraction (XRD), Fourier-transform infrared (FT-IR) spectroscopy, scanning electron microscopy (SEM), transmission electron microscopy (TEM), and UV-Vis-NIR spectroscopy. XRD analysis confirmed the formation of a polycrystalline orthorhombic V₂O₅ structure with high phase purity, while FT-IR spectra indicated the presence of characteristic V=O and V–O–V bonding structures. SEM and TEM images revealed a uniform, nanostructured surface morphology, conducive to efficient light absorption, making the films suitable for optoelectronic and energy storage applications. The vanadium oxide thin films exhibit an optical band gap of 2.3–2.5 eV, suitable for optoelectronic applications. The electrical conductivity of the films, measured using a four-probe configuration, demonstrated that the films exhibit semiconducting behavior with a conductivity range of 10⁻³ to 10⁻² S/cm. The results suggested that crystallinity, oxygen vacancies, and grain boundary effects play a pivotal role in enhancing conductivity, making the films promising for applications such as electrochromic devices, sensors, and photovoltaic systems.
How to Cite
Garima, Sunil Kumar Diwedi, "Fabrication and Characterization of Nanostructured Vanadium Oxide Thin Films for Energy and Optoelectronic Applications", Vol. 3, Issue 6, 08-09-2025, pp. 13-29.
